7ce558c6-1822-44fb-9fc1-eb71f8eed9b1
Fast, high-volume, and scalable yield management solutions. Automatically collect and clean more than 50 different semiconductor data types. Integrate with SAP ERP to provide yield solutions and identify the costs associated with manufacturing, yield, and consumables.
Overview
Faster yield ramp
Up to 30% faster time to yield target by linking manufacturing, test, equipment, yield, and ERP data and applying advanced analytics to determine where to focus your resources. Faster time to yield equals more parts out in less time. Significantly improve your profits while reducing cost.
Improve product quality
End-to-end analytics improves product quality down to 10 ppb by identifying the sources of variability in the manufacturing and assembly process that result in defective parts. Reduce customer returns, reliability risks, and field failures critical to the automotive, health, and defense industries.
Improve engineering efficiency
Up to 5x improvement in engineering efficiency. Analysis-ready data saves engineering time and effort by collecting and aligning data from the many siloes of data. Automated reports and guided analytics generate factory dashboards and deliver reports providing fast and intuitive visualizations.
Minimize analysis wait time with best in class performance & compute
Built on Cassandra (big data) and Spark. The platform provides up to 20x performance improvement in data ingestion, retrieval, and analytics when compared to relational databases. Enable your engineers to focus their valuable time on key issues - not data wrangling and waiting on results.
Details
Solution type
APIs and Technical Components
Industry
Consumer Products, Automotive, High Tech, Telecommunications
Compatibility
Works with
This product is compatible with or enhances the functionality of these SAP solutions but doesn't require them.
- SAP Datasphere
- SAP Business Technology Platform
- SAP S/4HANA Enterprise Management
- SAP Analytics Cloud for planning
- SAP S/4HANA Cloud Public Edition
Features
Reduce non-value add engineering time with automated analysis & reports
Pre-configured analysis templates cover common application cases for semiconductor manufacturing. All templates can be added to Workflow for generating actions and dpMonitor or automation services for scheduling time or event-based auto-reporting and analysis.
Minimize data wrangling with analysis-ready semantic data model
Semiconductor data model that supports, integrates, and aligns all manufacturing data. Over 50 data types across the entire semiconductor life cycle. Enables users to focus their time on achieving results, not data management.
Respond immediately to factory issues with dashboards & monitoring
Monitor the factory from an easy-to-use dashboard. Automatically identify the cause of yield excursions with automated drill down from rule-based alarms and trends to the most likely root cause of the signal.
Perform interactive ad-hoc analysis
Highly flexible tool for deep-dive analysis across multiple data sets. Allows the users to perform ad-hoc analysis. Users can bring in data from all sources and identify key interactions. Any analysis can be saved in templates for automation or repeated analysis.
Analyze spatial issues with automated wafermaps
Analysis and algorithms designed to identify spatial signatures resulting in yield loss. Signature library reduces time to root cause yield loss identification.
Plans and pricing
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- End-to-end analysis ready semantic data model with built-in IC models and domain knowledge
- Spotfire based interactive visualization tools and user interface
- Defect management system for correlating defects to yield loss
- Advanced Analysis and Automation and Reporting Features
- Advanced Insights to Manufacturing (AIM) - AI/ML Solutions targeted to solve specific problems/needs
- Guided Analytics (GA) - Structured data analytics to guide users in problem solving
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- State-of-the-art analytics solution on the PDF Cloud or on-premise
- End-to-end analysis ready semantic data model
- Built-in domain knowledge like IC models, wafer maps, and analysis tools
- Defect management system for correlating defects to yield loss
- Spotfire based interactive visualization tools and user interface
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Customer reviews
7ce558c6-1822-44fb-9fc1-eb71f8eed9b1
Technical Information
Technical details
| Solution type | APIs and Technical Components |
| Category | Manufacturing |
| Industry | Consumer Products, Automotive, High Tech, Telecommunications |
| Works with |
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Deployment and operations
The following information is provided by the publisher and applies to the latest app version available on the SAP Store. SAP does not control these policies and procedures; the publisher is solely responsible for the accuracy of the provided information.
| Deployment |
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| Operations |
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Security and compliance
The following information is provided by the publisher and applies to the latest app version available on the SAP Store. SAP does not control these policies and procedures; the publisher is solely responsible for the accuracy of the provided information.
| Security |
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| Privacy policy |
SAP's privacy policy is not applicable to the use of this app. Please refer to the privacy policy provided by this app's partner. |
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Resources
Advanced Insights for Manufacturing - Machine Learning + Decades of Experience
End-to-End Analytics to Accelerate Yield Ramp and Reach Volume Production Faster
Exensio Analytics Platform - The Right Product for Every Data Analytics Task
Publisher
Pdf Solutions, Inc.
PDF provides advanced data analytics, machine learning, and equipment connectivity products, services, and systems for the semiconductor supply chain. With over 400 customers worldwide, PDF is the only commercial data and analytics-focused provider with the breadth & scale required by our customers
More solutions provided by {{publisher}} Pdf Solutions, Inc.
products
2001015761,2001014728
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