End-to-End Analytics to Accelerate Yield Ramp & Reach Volume Production Faster
Fast, high-volume, and scalable yield management solutions. Automatically collect and clean more than 50 different semiconductor data types. Integrate with SAP ERP to provide yield solutions and identify the costs associated with manufacturing, yield, and consumables.
Overview
Faster yield ramp
Up to 30% faster time to yield target by linking manufacturing, test, equipment, yield, and ERP data and applying advanced analytics to determine where to focus your resources. Faster time to yield equals more parts out in less time. Significantly improve your profits while reducing cost.
Improve product quality
End-to-end analytics improves product quality down to 10 ppb by identifying the sources of variability in the manufacturing and assembly process that result in defective parts. Reduce customer returns, reliability risks, and field failures critical to the automotive, health, and defense industries.
Improve engineering efficiency
Up to 5x improvement in engineering efficiency. Analysis-ready data saves engineering time and effort by collecting and aligning data from the many siloes of data. Automated reports and guided analytics generate factory dashboards and deliver reports providing fast and intuitive visualizations.
Details
Solution type
APIs and Technical Components
Industry
Consumer Products, Automotive, High Tech, Telecommunications
Compatibility
Works with
Features
Reduce non-value add engineering time with automated analysis & reports
Pre-configured analysis templates cover common application cases for semiconductor manufacturing. All templates can be added to Workflow for generating actions and dpMonitor or automation services for scheduling time or event-based auto-reporting and analysis.

Minimize data wrangling with analysis-ready semantic data model
Semiconductor data model that supports, integrates, and aligns all manufacturing data. Over 50 data types across the entire semiconductor life cycle. Enables users to focus their time on achieving results, not data management.

Respond immediately to factory issues with dashboards & monitoring
Monitor the factory from an easy-to-use dashboard. Automatically identify the cause of yield excursions with automated drill down from rule-based alarms and trends to the most likely root cause of the signal.


